 h a l f b a k e r y You could have thought of that.
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Would the process be more or less sensitive to surface variations than current photographic processes? |
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As with a lens system there would be exactly one distance that the wafer would be 'in focus' so any surface variation would be 'out of focus'. I don't think it would be too much worse than a lens though. |
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One of the main problems with this invention is a source of coherent x-rays or electron beams (ie x-ray or electron lasers). |
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Electron beams can be focused using magnetic lenses, and
such is done regularly in
scanning/transmission electron microscopes. While
coherent electron sources are expensive, they are
available and are also used in TEM used for high-resolution
work. |
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Coherent sources are not strictly required for imaging,
only for hi-res and diffraction work. |
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Some of the semiconductor manufacturing setups in the
electrical engineering department at this university have
an electron beam directed at the surface of the sample.
The beam diffracts off the surface - no grating required -
and the lines are visible on a phosphorent screen on the
other side. |
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My understanding of interferometric lithography is limited to "light passing through a set of gratings will produce a pattern". However, I think this technology is being used, and has been used for several years to produce submicron circuitry. |
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